Bahtiar, Satya Abdul, Chandra Dewa, and Ahmad Luthfi. “Comparison of Naïve Bayes and Logistic Regression in Sentiment Analysis on Marketplace Reviews Using Rating-Based Labeling”. Journal of Information Systems and Informatics 5, no. 3 (August 29, 2023): 915-927. Accessed September 27, 2025. https://journal-isi.org/index.php/isi/article/view/539.